Fibre-Coupled Rapid Scan THz Generalized Ellipsometer

Mr. Huiliang Ou1, Dr. Rayko Stantchev2, Dr. Mykhaylo Semtsiv3, Prof. William Masselink3, Prof. James Lloyd-Hughes1, Prof. Emma Pickwell-MacPherson1
1University of Warwick, Coventry, United Kingdom. 2National Sun Yat-Sen University, Kaohsiung, Taiwan. 3Humboldt Universit of Berlin, Berlin, Germany


In this work, we report a THz generalized Ellipsometer which is able to independently genereate and detect s- and p- polarization by tailoring the metal pattern of photoconductive antennas used as both the emitter and detecotr. Coupled with a rapid-scanning delay line (10Hz), we are therefore able to retrieve the optical constants of birefringent samples with randomly orientated optical axis without cumbersome extra components or time-consuming mechanical operations.